XRF

Journal des Clients "l'échantillon" (4)

l'echantillon no. 34
NOUVEAUTÉS PRODUITS '09

No. 32
PRÉPARATION D’ÉCHANTILLONS pour l’analyse instrumentale

No. 31
GRAND PRIX Saison 2008 & RETSCH nouveautés

No. 29
Nouveautés Les appareils de la génération 2007

Rapport de tests (4)

Préparation d’échantillons pour l’analyse par fluorescence X
De l’échantillon à la pastille

As pure as possivle
Even if size reduction is carried out under ideal conditions, the mechanical stress which the sample material exerts on the surface of the grinding tool causes abrasion. However, it is possible to minimize this effect by selecting suitable mills and grinding tools. If the sample material needs to be ground to sizes below 100 microns, strong mechanical forces are required which increase abrasion.

Representative sample preparation for XRF analysis
Preparing homogeneous samples by milling

The preparation of samples of solid substances for spectroscopic analysis
X-ray fluorescence spectrometry is one of the most versatile multi-element methods of chemical analysis. The technique is based on excitation of fluorescent radiation from a sample by bombarding it with high energy X-ray quanta and subsequent study of the characteristic X-ray radiation emitted by its elements.